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Thermal-Aware Testing of Digital VLSI Circuits and Systems by Santanu Chattopadhyay

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9780815378822
MPN:
9780815378822
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Description

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

Book Information
ISBN 9780815378822
Author Santanu Chattopadhyay
Format Hardback
Page Count 118
Imprint CRC Press Inc
Publisher Taylor & Francis Inc
Weight(grams) 295g

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