Statistical Analysis and Modeling of Geographic Information with ArcView GIS is an update to Lee and Wong's Statistical Analysis with ArcView GIS, featuring expanded coverage of classical statistical methods, probability and statistical testing, new student exercises to facilitate classroom use, new exercises featuring interactive ArcView Avenue scripts, and a new overview of compatible spatial analytical functions in ArcGIS 9.0.

About the Author
David W. S. Wong, PhD, is Professor and Chair of the Earth Systems and GeoInformation Sciences Program at George Mason University in Fairfax, Virginia.

Jay Lee, PhD, is Professor and Chair of the Department of Geography at Kent State University in Kent, Ohio.

Book Information
ISBN 9780471468998
Author David W. S. Wong
Format Hardback
Page Count 464
Imprint John Wiley & Sons Inc
Publisher John Wiley & Sons Inc
Weight(grams) 762g
Dimensions(mm) 239mm * 164mm * 29mm