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Practical Electron Microscopy Of Lattice Defects by Hiroyasu Saka 9789811234699

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'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

Book Information
ISBN 9789811234699
Author Hiroyasu Saka
Format Hardback
Page Count 308
Imprint World Scientific Publishing Co Pte Ltd
Publisher World Scientific Publishing Co Pte Ltd

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