Properties of wave localization play a decisive role both in applications of engineered microstructures and in the detection of cracks and flaws. The papers in this volume give an introduction into a variety of interrelated dynamic localization phenomena occurring in elasticity, acoustics and electromagnetism. In particular, these involve surface and edge waves and also trapped modes localized near defects, shape changes and the edges of elongated waveguides. The effects of layering, prestress, anisotropy, periodic microstructures as well as various multi-field phenomena are addressed with reference to underlying industrial problems. The essential and up-to-date numerical, asymptotic, and analytical techniques are covered as well as relevant continuum theories that are required to make progress in, and understand wave localization and allied effects. A major focus is on a qualitative physical insight into the mechanisms of dynamic localization.

Book Information
ISBN 9783709117583
Author Richard V. Craster
Format Paperback
Page Count 256
Imprint Springer Verlag GmbH
Publisher Springer Verlag GmbH
Weight(grams) 4044g