Digital Integrated Circuit Testing from a Quality Perspective by Eugene R. Hnatek 9780442006433

Name: Digital Integrated Circuit Testing from a Quality Perspective by Eugene R. Hnatek 9780442006433
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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

Book Information
ISBN 9780442006433
Author Eugene R. Hnatek
Format Hardback
Page Count 180
Imprint Van Nostrand Reinhold Inc.,U.S.
Publisher Van Nostrand Reinhold Inc.,U.S.
Weight(grams) 1000g

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