Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Examines the causes and effects of semiconductor laser diode degradation, providing a tool for linking practical measurements to physical diagnostics
About the Author
Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices Laurent Bechou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystemes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems. Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories. Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.
Book Information
ISBN 9781785481543
Author Massimo Vanzi
Format Hardback
Page Count 268
Imprint ISTE Press Ltd - Elsevier Inc
Publisher ISTE Press Ltd - Elsevier Inc
Weight(grams) 1000g
Examines the causes and effects of semiconductor laser diode degradation, providing a tool for linking practical measurements to physical diagnostics
About the Author
Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices Laurent Bechou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystemes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems. Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories. Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.
Book Information
ISBN 9781785481543
Author Massimo Vanzi
Format Hardback
Page Count 268
Imprint ISTE Press Ltd - Elsevier Inc
Publisher ISTE Press Ltd - Elsevier Inc
Weight(grams) 1000g
