The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

About the Author
Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).

Reviews

"This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)." (Imaging & Microscopy, 1 March 2012)

Book Information
ISBN 9780470518519
Author Rik Brydson
Format Hardback
Page Count 304
Imprint John Wiley & Sons Inc
Publisher John Wiley & Sons Inc
Weight(grams) 581g
Dimensions(mm) 236mm * 160mm * 20mm