Description
Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
About the Author
C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.
David B. Williams is the Monte Ahuja Endowed Dean's Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.
Reviews
"I would highly recommend this 'companion' volume for researchers and students of the materials and applied sciences; in fact, anybody using transmission electron microscopy in their research will extract many practical ideas ... . Because of the high quality of the photographic images, composite illustrations, and text presentations, I suggest that this book has a place on the shelf of any electron microscopy laboratory. ... The editors have put together a wonderful review volume that is well worth the read." (David C. Bell, Microscopy and Microanalysis, Vol. 24 (03), June, 2018)
"Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. ... The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent." (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)
Book Information
ISBN 9783319266497
Author C. Barry Carter
Format Hardback
Page Count 518
Imprint Springer International Publishing AG
Publisher Springer International Publishing AG