Description
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Book Information
ISBN 9780367607098
Author Santanu Chattopadhyay
Format Paperback
Page Count 118
Imprint CRC Press
Publisher Taylor & Francis Ltd
Weight(grams) 260g
