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Thermal-Aware Testing of Digital VLSI Circuits and Systems by Santanu Chattopadhyay 9780367607098

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Description

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level

Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques

This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips



Book Information
ISBN 9780367607098
Author Santanu Chattopadhyay
Format Paperback
Page Count 118
Imprint CRC Press
Publisher Taylor & Francis Ltd
Weight(grams) 260g

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