Description
Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards.
In particular, addresses:
IEEE Std 1149.1 Digital Boundary-ScanIEEE Std 1149.4 Analog Boundary-ScanIEEE Std 1149.6 Advanced I/O TestingIEEE Std 1149.8.1 Passive Component TestingIEEE Std 1149.1-2013 The 2013 Revision of 1149.1IEEE Std 1532 In-System ConfigurationIEEE Std 1149.6-2015 The 2015 Revision of 1149.6
About the Author
Dr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies.
Book Information
ISBN 9783319330693
Author Kenneth P. Parker
Format Paperback
Page Count 552
Imprint Springer International Publishing AG
Publisher Springer International Publishing AG