Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

About the Author

ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.

Reviews
"...a valuable reference..." (Microelectronics Reliability, Vol. 43, 2003)



Book Information
ISBN 9780780310001
Author Ashok K. Sharma
Format Hardback
Page Count 480
Imprint Wiley-IEEE Press
Publisher John Wiley & Sons Inc
Weight(grams) 1043g
Dimensions(mm) 257mm * 183mm * 33mm