Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Fred Stevie 9781606505885

Name: Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Fred Stevie 9781606505885
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This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

Book Information
ISBN 9781606505885
Author Fred Stevie
Format Paperback
Page Count 150
Imprint Momentum Press
Publisher Momentum Press

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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Fred Stevie 9781606505885

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