Description
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
* Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
* Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
* Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
* Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
* Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
About the Author
Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in 1992 at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Paul has since been heavily involved in the application and development of SIMS at the University of Western Ontario, the University of Houston (where he also filled in various Professor level positions), Samsung Austin Semiconductor, and most recently at GlobalFoundries (NY). Paul has ~100 publications with this representing his 2nd book.
Reviews
Book Information
ISBN 9781118480489
Author Paul van der Heide
Format Hardback
Page Count 384
Imprint John Wiley & Sons Inc
Publisher John Wiley & Sons Inc
Weight(grams) 662g
Dimensions(mm) 241mm * 163mm * 25mm
* Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
* Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
* Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
* Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
* Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
About the Author
Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in 1992 at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Paul has since been heavily involved in the application and development of SIMS at the University of Western Ontario, the University of Houston (where he also filled in various Professor level positions), Samsung Austin Semiconductor, and most recently at GlobalFoundries (NY). Paul has ~100 publications with this representing his 2nd book.
Reviews
"It is well worth owning if you want to learn about this exciting surface science technique for studying materials." (IEEE Electrical Engineering magazine, 1 May 2015)
"The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied scientific fields, including the biosciences, where SIMS is now becoming a major experimental method." (Anal Bioanal Chem, 21 February 2015)
Book Information
ISBN 9781118480489
Author Paul van der Heide
Format Hardback
Page Count 384
Imprint John Wiley & Sons Inc
Publisher John Wiley & Sons Inc
Weight(grams) 662g
Dimensions(mm) 241mm * 163mm * 25mm
