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Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek 9783030081980
Booksplease Price: £46.28This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author... -
Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek 9783319912035
Booksplease Price: £46.28This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author...