Filter By
Books (1)
- Book
- Qty in Cart
- Quantity
- Price
- Subtotal
-
High Resolution X-Ray Diffractometry And Topography by D. Keith Bowen
RRP: £69.99Booksplease Price: £62.04The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book...