Filter By
Books (6)
- Book
- Qty in Cart
- Quantity
- Price
- Subtotal
-
Graphene and ULSI Interconnects by Cher Ming Tan
RRP: £116.00Booksplease Price: £100.90Copper (Cu) has been used as an interconnection material in the semiconductor industry for years owing to its best balance of conductivity and performance. However, it is running out of steam as it... -
Electromigration In Ulsi Interconnections by Cher Ming Tan 9789814273329
RRP: £100.00Booksplease Price: £88.41Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on... -
Reliability Analysis of Electrotechnical Devices by Cher Ming Tan 9783036546537
RRP: £52.87Booksplease Price: £41.03Apologies but we at Booksplease don't have a full description for this book.Book InformationISBN 9783036546537Author Cher Ming TanFormat HardbackPage Count 174Imprint Mdpi AGPublisher Mdpi... -
Electromigration Modeling at Circuit Layout Level by Cher Ming Tan 9789814451208
Booksplease Price: £46.28Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect... -
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan 9781447126416
Booksplease Price: £92.24Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI... -
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan 9780857293091
Booksplease Price: £90.56Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI...