This book presents an in-depth treatment of various power reduction and speed enhancement techniques based on multiple supply and threshold voltages. A detailed discussion of the sources of power consumption in CMOS circuits will be provided whilst focusing primarily on identifying the mechanisms by which sub-threshold and gate oxide leakage currents are generated. The authors present a comprehensive review of state-of-the-art dynamic, static supply and threshold voltage scaling techniques and discuss the pros and cons of supply and threshold voltage scaling techniques.

About the Author

DR VOLKAN KURSUN, Department of Electrical & Computer Engineering, University of Rochester, Rochester, New York 14627-0231, USA.

PROFESSOR DR EBY G. FRIEDMAN, Department of Electrical & Computer Engineering , University of Rochester , Rochester, New York 14627-0231, USA.

Book Information
ISBN 9780470010235
Author Volkan Kursun
Format Hardback
Page Count 242
Imprint John Wiley & Sons Inc
Publisher John Wiley & Sons Inc
Weight(grams) 621g
Dimensions(mm) 252mm * 173mm * 20mm