This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopies and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, minerology, semiconductors, and metals. Contributors include: J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.

Book Information
ISBN 9780195042757
Author Peter R. Buseck
Format Hardback
Page Count 666
Imprint Oxford University Press Inc
Publisher Oxford University Press Inc
Weight(grams) 1150g