The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

Book Information
ISBN 9783319735573
Author Jens Lienig
Format Hardback
Page Count 159
Imprint Springer International Publishing AG
Publisher Springer International Publishing AG
Weight(grams) 3908g