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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, by Lawrence E. Murr 9780367402945

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Description

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Book Information
ISBN 9780367402945
Author Lawrence E. Murr
Format Paperback
Page Count 856
Imprint CRC Press
Publisher Taylor & Francis Ltd
Weight(grams) 1578g

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