Description
Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystal structure determination. The main aim of the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed. Since the first edition was published in 2004 there have been major improvements both in the experimental methods for recording diffuse scattering and in our ability to analyse it. The advent of new and better detectors means that fully 3-dimensional diffuse scattering data can be collected routinely for even quite small samples and computational power that is now available has continued its upward trend, meaning modelling calculations inconceivable in 2004 are now routine. The final part of the book traces these recent developments and outlines their future potential in the field.
About the Author
Following his PhD degree (1968-1970) in Kathleen Lonsdale's Chemical Crystallography Laboratory at University College, London and a Postdoctoral Fellowship at University College Cardiff, T. R. Welberry was appointed to the Research School of Chemistry at ANU in 1975 and subsequently became full Professor and is now an Emeritus Professor. He was Co-editor of two IUCr Journals over a period of 15 years and is now Editor of International Tables for Crystallography Vol. C.
Reviews
Diffuse X-ray Scattering and Models of Disorder remains essential reading for anyone interested in diffuse scattering methods -- novice and expert alike. For the novice, there is the helpful background one needs to enter the field, and the advantage of learning from the experience of one of the field's true pioneers. For the expert, the text is rich with nuggets of profound insight into the structures of disordered systems and the relationship between disorder and the scattering function. * A. L. Goodwin, Crystallography News *
Book Information
ISBN 9780198862482
Author T.R. Welberry
Format Hardback
Page Count 424
Imprint Oxford University Press
Publisher Oxford University Press
Weight(grams) 1g
Dimensions(mm) 240mm * 170mm * 25mm
About the Author
Following his PhD degree (1968-1970) in Kathleen Lonsdale's Chemical Crystallography Laboratory at University College, London and a Postdoctoral Fellowship at University College Cardiff, T. R. Welberry was appointed to the Research School of Chemistry at ANU in 1975 and subsequently became full Professor and is now an Emeritus Professor. He was Co-editor of two IUCr Journals over a period of 15 years and is now Editor of International Tables for Crystallography Vol. C.
Reviews
Diffuse X-ray Scattering and Models of Disorder remains essential reading for anyone interested in diffuse scattering methods -- novice and expert alike. For the novice, there is the helpful background one needs to enter the field, and the advantage of learning from the experience of one of the field's true pioneers. For the expert, the text is rich with nuggets of profound insight into the structures of disordered systems and the relationship between disorder and the scattering function. * A. L. Goodwin, Crystallography News *
Book Information
ISBN 9780198862482
Author T.R. Welberry
Format Hardback
Page Count 424
Imprint Oxford University Press
Publisher Oxford University Press
Weight(grams) 1g
Dimensions(mm) 240mm * 170mm * 25mm
