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Design, Analysis and Test of Logic Circuits Under Uncertainty by Smita Krishnaswamy 9789048196432

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Description

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Book Information
ISBN 9789048196432
Author Smita Krishnaswamy
Format Hardback
Page Count 124
Imprint Springer
Publisher Springer
Weight(grams) 3317g

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