A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.

The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.
Reviews
'The quest for making better materials is ultimately linked to understanding the role of each individual atom in its place and its chemical environment. Three pioneers in the field guide us through a comprehensive scenario of how this can be achieved by combining the two most advanced atomic-scale characterization techniques: atom probe tomography and transmission electron microscopy.' Joachrim Mayer, RWTH Aachen University



Book Information
ISBN 9781107162501
Author Thomas F. Kelly
Format Hardback
Page Count 264
Imprint Cambridge University Press
Publisher Cambridge University Press
Weight(grams) 630g
Dimensions(mm) 250mm * 175mm * 18mm