Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today's technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders-from graduate students to scholars to industry professionals-have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.

About the Author

Mark J. Gierl is Professor of Educational Psychology at the University of Alberta, Canada. He holds the Tier 1 Canada Research Chair in Educational Measurement.

Hollis Lai is Associate Professor of Dentistry in the Faculty of Medicine and Dentistry at the University of Alberta, Canada.

Vasily Tanygin is a full-stack software developer who has over a decade of experience creating automatic item generation and educational assessment technologies. He graduated with a specialist degree in software systems development from Mari State Technical University, Russia.

Book Information
ISBN 9780367902933
Author Mark J. Gierl
Format Hardback
Page Count 246
Imprint Routledge
Publisher Taylor & Francis Ltd
Weight(grams) 458g