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Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons by Sunil K Sinha

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Description

Since the beginning of this century, there has been an enormous amount of fundamental and applied research and development in the fields of nanoscience and nanotechnology due to the simple fact that many materials confined within nanometer length-scales from any of the three directions can exhibit size and shape tunable properties. The controlled assembly of these nano-sized materials, known as nanomaterials, in macroscopic form by maintaining the confinement-induced properties of individual nano-objects has remained a challenge which is of enormous technological importance. Important applications of such nano-assembled structures are evident in fields such as electronics, photonics, chemical sensing, biological labeling and drug delivery. Several novel assembly routes of various nanomaterials have been reported to date and these methods include directed assemblies induced by external fields, templating with suitable cavities or channels, various evaporative or lithographic processes, liquid interface guided methods, and entropy-driven self-assemblies. Various self-assembly processes involving DNA and surfactant guided methods are also being discovered. Together with this, structural and spectroscopic studies of individual nanoparticles and assembled aggregates of nanoparticles are being carried out, particularly in in-situ and in-operando conditions for the advancement of nanoscience and nanotechnology. This volume is devoted to characterization techniques for the structure and dynamics of various types of nanomaterials.

Book Information
ISBN 9789811231506
Author Sunil K Sinha
Format Hardback
Page Count 424
Imprint World Scientific Publishing Co Pte Ltd
Publisher World Scientific Publishing Co Pte Ltd

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