This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

Book Information
ISBN 9780792378617
Author Yi-Kan Cheng
Format Hardback
Page Count 210
Imprint Springer
Publisher Springer
Weight(grams) 1140g